Applications
- Nano-materials
- Polymers, organic films
- Inorganic materials and minerals
- Semiconductors
- Microelectronics
- Biology, medicine, pharmacy
Simultaneous and colocalized sample investigation by scanning probe microscopy & Raman microscopy/ spectroscopy methods.
Comprehensive physical & chemical analysis.
In order to get the complete information about the sample under investigation, a combination of several measurement techniques is often useful. The NTEGRA Spectra nanolaboratory is the world's first full-featured integration of a scanning probe microscopy together with confocal Raman/ photoluminescence microscopy and spectroscopy.
The NTEGRA Spectra works in almost all of existing AFM and STM modes (more than 40), providing comprehensive information of the sample physical properties with nanometer resolution: local topography, stiffness, elasticity, conductivity, capacitance, magnetization, surface potential, friction, piezo response, etc. Different types of probe sensors can be used with the probe head.
Confocal photoluminescence and Raman measurements can be done simultaneously with SPM measurements on the same sample area providing information on the chemical compounds of the sample, its crystal structure, its orientation and deformation, impurities and defects, conformation of macromolecules, etc.
The NTEGRA Spectra optical scheme provides the light-paths from the source to the probe and to the sample, and for recording the emission radiation, optimized in design to maximize the gain of the useful signal. The instrument can get the emission signal from a localized spot few nanometers in diameter on the sample surface directly under the probe tip. Even single molecules can be detected and recognized from their spectra this way. The lateral resolution of Raman (TERS) and photoluminescence (TEPL) maps taken by the NTEGRA Spectra is no longer restricted by the Abbe diffraction limit and can be less than 10 nm.
Three channels of the NTEGRA Spectra input/ output system allow to drive the excitation laser light onto the sample and to collect the emission signal via top, side and bottom optical channels. All three channels can be installed individually or simultaneously within the system.
NTEGRA Spectra is a confocal laser, Raman and photoluminescence microscope in its basic version. The instrument provides sample visualization, focusing of the excitation laser onto the sample and collecting of emission radiation coming from the sample. Micro-mapping can be accomplished by moving the sample and/ or moving the laser focus by means of galvo-mirrors.
NTEGRA Spectra in the extended version “probe microscopy + optical microspectroscopy” allows to carry out measurements separately in SPM, confocal microscopy, Raman and photoluminescence microspectroscopy methods, as well as to study the sample by simultaneous combination all of the above methods, via scanning by sample and/ or probe and/ or laser focus, obtaining finally the colocalized maps of any recorded signals, point-by-point linked to each other.
NTEGRA Spectra in upright configuration,
“optics & spectroscopy”
NTEGRA Spectra in upright configuration,
“optics & spectroscopy”
NTEGRA Spectra in upright configuration,
SIO TOP and automated optical measuring head
NTEGRA Spectra in upright configuration,
combined SIO TOP & SIO SIDE, appropriate for TERS
NTEGRA Spectra in upright configuration,
SIO TOP and manual optical measuring head
NTEGRA Spectra in inverted configuration on Olympus optical microscope
| Scanning | |
| Scanning modes | by sample by laser beam both by sample and laser beam |
| Sample positioning | |
| Sample stage | motorized |
| Stage movement range | 130×80 mm (5×5 mm for SPM & combined measurements) |
| Sample weight and dimensions (in extended configuration) | |
| Sample size | up to Ø 40 mm × 10 mm |
| Sample weight | up to 100 g |
| Scanning by sample (in extended configuration) | |
| Scan range | 100×100×10 µm (±10%) |
| Non linearity, XY | ≤ 0.1 % |
| Noise level, Z (RMS in bandwidth 1 kHz) | ≤ 0.04 nm |
| Measuring head | |
| Deflectometer tuning | manual or automated |
| Deflectometer laser wavelength | choice of: 650 nm, 830 nm, 1300 nm |
| Optical parameters | |
| Objectives | magnification up to 100 X aperture up to 0.70 in the top channel (with probe holder installed) aperture up to 1.0 in the top channel (without probe holder installed) aperture up to 1.45 in the bottom channel |
| Diffraction gratings | up to 4 pcs. on the turret, to choose from: 150, 300, 600, 1200, 1800, 2400 gr/mm |
| Laser sources | |
| Quantity | up to 5 (4 built-in + one external) |
| Power | up to 120 mW |
| Wavelength range | from 400 to 800 nm |
| Polarization | linear |
| Beam profile | Gaussian TEM00, single longitudinal mode (SLM) |
| Monochromator entrance slit width | from 0 to 2000 µm step – 1 µm |
| Neutral density filters | ND=0.4 |
| Edge/notch filters | 8-position wheel, for filters Ø 12.5 mm and Ø 25 mm |
| Beam expander | optimized to fill out the objective lens pupil entrance |
| Calibration lamp | two-element hollow cathode |
| Detectors | CCD detector PMT (optional) APD (optional) |